Delay Fault Testing of Embedded Cores using an Enhanced P1500 Compliant Wrapper

H.J. Vermaak, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of Program for Research on Integrated Systems and Circuits 2003
Place of Publication	Veldhoven, The Netherlands
Pages	158-164
Number of pages	7
Publication status	Published - 25 Nov 2003

Keywords

@inproceedings{c60c55adacfc43ef853fbbd677a5dcf6,

title = "Delay Fault Testing of Embedded Cores using an Enhanced P1500 Compliant Wrapper",

keywords = "METIS-214057",

author = "H.J. Vermaak and Kerkhoff, {Hans G.}",

year = "2003",

month = nov,

day = "25",

language = "Undefined",

pages = "158--164",

booktitle = "Proceedings of Program for Research on Integrated Systems and Circuits 2003",

}