Delay Fault Testing of Embedded Cores using an Enhanced P1500 Compliant Wrapper

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of Program for Research on Integrated Systems and Circuits 2003
    Place of PublicationVeldhoven, The Netherlands
    Pages158-164
    Number of pages7
    Publication statusPublished - 25 Nov 2003

    Keywords

    • METIS-214057

    Cite this

    Vermaak, H. J., & Kerkhoff, H. G. (2003). Delay Fault Testing of Embedded Cores using an Enhanced P1500 Compliant Wrapper. In Proceedings of Program for Research on Integrated Systems and Circuits 2003 (pp. 158-164). Veldhoven, The Netherlands.