Delay Fault Testing of Embedded Cores using an Enhanced P1500 Compliant Wrapper

H.J. Vermaak, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of Program for Research on Integrated Systems and Circuits 2003
    Place of PublicationVeldhoven, The Netherlands
    Number of pages7
    Publication statusPublished - 25 Nov 2003


    • METIS-214057

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