Delay Fault Testing of Embedded Cores

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 4th Workshop on Embedded Systems (PROGRESS 2003)
Publisher	STW
Pages	250-256
Number of pages	7
ISBN (Print)	90-73461-37-5
Publication status	Published - 1 Oct 2003
Event	4th PROGRESS Symposium on Embedded Systems 2003 - Nieuwegein, Netherlands Duration: 22 Oct 2003 → 22 Oct 2003 Conference number: 4

Conference	4th PROGRESS Symposium on Embedded Systems 2003
Abbreviated title	PROGRESS
Country/Territory	Netherlands
City	Nieuwegein
Period	22/10/03 → 22/10/03

Cite this

@inproceedings{59e3441ea5f141b6a13a54ced1601e8f,

title = "Delay Fault Testing of Embedded Cores",

author = "H.J. Vermaak and H.G. Kerkhoff",

year = "2003",

month = oct,

day = "1",

language = "English",

isbn = "90-73461-37-5",

pages = "250--256",

booktitle = "Proceedings of the 4th Workshop on Embedded Systems (PROGRESS 2003)",

publisher = "STW",

note = "4th PROGRESS Symposium on Embedded Systems 2003, PROGRESS ; Conference date: 22-10-2003 Through 22-10-2003",

}

TY - GEN

T1 - Delay Fault Testing of Embedded Cores

AU - Vermaak, H.J.

AU - Kerkhoff, H.G.

N1 - Conference code: 4

PY - 2003/10/1

Y1 - 2003/10/1

M3 - Conference contribution

SN - 90-73461-37-5

SP - 250

EP - 256

BT - Proceedings of the 4th Workshop on Embedded Systems (PROGRESS 2003)

PB - STW

T2 - 4th PROGRESS Symposium on Embedded Systems 2003

Y2 - 22 October 2003 through 22 October 2003

ER -