Delay fault testing using path delay equivalent labeling

G. van Brakel, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the ProRISC IEEE Benelux, Workshop on Circuits, Systems and Signal Processing
Place of Publication	Papendal, Arnhem
Pages	53-57
Publication status	Published - 24 Mar 1994

Keywords

@inproceedings{2a494d2ba7574dc1a2c4244e3de63285,

title = "Delay fault testing using path delay equivalent labeling",

keywords = "METIS-112930",

author = "{van Brakel}, G. and Kerkhoff, {Hans G.}",

year = "1994",

month = mar,

day = "24",

language = "Undefined",

pages = "53--57",

booktitle = "Proceedings of the ProRISC IEEE Benelux, Workshop on Circuits, Systems and Signal Processing",

}