Delineation of diseased tea patches using MXL and texture based classification

R. Dutta; A. Stein; N.R. Patel

Delineation of diseased tea patches using MXL and texture based classification

R. Dutta
, A. Stein
, N.R. Patel

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

47 Downloads (Pure)

Original language	English
Title of host publication	XXIst ISPRS Congress: Silk road for information from imagery
Subtitle of host publication	Technical Commission IV, July 3-11, 2008 Beijing, China
Editors	Jun Chen, Jie Jiang, Shailesh Nayak
Place of Publication	Beijing, China
Publisher	International Society for Photogrammetry and Remote Sensing (ISPRS)
Pages	1693-1700
Volume	Part B4
Publication status	Published - 2008

Keywords

ADLIB-ART-1534
EOS

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ArticleFinal published version, 1.24 MB

https://webapps.itc.utwente.nl/library/2008/conf/stein_del.pdf

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Dutta, R., Stein, A., & Patel, N. R. (2008). Delineation of diseased tea patches using MXL and texture based classification. In J. Chen, J. Jiang, & S. Nayak (Eds.), XXIst ISPRS Congress: Silk road for information from imagery: Technical Commission IV, July 3-11, 2008 Beijing, China (Vol. Part B4, pp. 1693-1700). International Society for Photogrammetry and Remote Sensing (ISPRS). https://webapps.itc.utwente.nl/library/2008/conf/stein_del.pdf

Dutta, R. ; Stein, A. ; Patel, N.R. / Delineation of diseased tea patches using MXL and texture based classification. XXIst ISPRS Congress: Silk road for information from imagery: Technical Commission IV, July 3-11, 2008 Beijing, China. editor / Jun Chen ; Jie Jiang ; Shailesh Nayak. Vol. Part B4 Beijing, China : International Society for Photogrammetry and Remote Sensing (ISPRS), 2008. pp. 1693-1700

@inproceedings{f918d4b1e0db44f2a3b1e85571a6b458,

title = "Delineation of diseased tea patches using MXL and texture based classification",

keywords = "ADLIB-ART-1534, EOS",

author = "R. Dutta and A. Stein and N.R. Patel",

year = "2008",

language = "English",

volume = "Part B4",

pages = "1693--1700",

editor = "Jun Chen and Jie Jiang and Shailesh Nayak",

booktitle = "XXIst ISPRS Congress: Silk road for information from imagery",

publisher = "International Society for Photogrammetry and Remote Sensing (ISPRS)",

}

Dutta, R, Stein, A & Patel, NR 2008, Delineation of diseased tea patches using MXL and texture based classification. in J Chen, J Jiang & S Nayak (eds), XXIst ISPRS Congress: Silk road for information from imagery: Technical Commission IV, July 3-11, 2008 Beijing, China. vol. Part B4, International Society for Photogrammetry and Remote Sensing (ISPRS), Beijing, China, pp. 1693-1700. <https://webapps.itc.utwente.nl/library/2008/conf/stein_del.pdf>

Delineation of diseased tea patches using MXL and texture based classification. / Dutta, R.; Stein, A.; Patel, N.R.
XXIst ISPRS Congress: Silk road for information from imagery: Technical Commission IV, July 3-11, 2008 Beijing, China. ed. / Jun Chen; Jie Jiang; Shailesh Nayak. Vol. Part B4 Beijing, China: International Society for Photogrammetry and Remote Sensing (ISPRS), 2008. p. 1693-1700.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Delineation of diseased tea patches using MXL and texture based classification

AU - Dutta, R.

AU - Stein, A.

AU - Patel, N.R.

PY - 2008

Y1 - 2008

KW - ADLIB-ART-1534

KW - EOS

UR - https://www.isprs.org/proceedings/XXXVII/congress/tc4.aspx

M3 - Conference contribution

VL - Part B4

SP - 1693

EP - 1700

BT - XXIst ISPRS Congress: Silk road for information from imagery

A2 - Chen, Jun

A2 - Jiang, Jie

A2 - Nayak, Shailesh

PB - International Society for Photogrammetry and Remote Sensing (ISPRS)

CY - Beijing, China

ER -

Dutta R, Stein A, Patel NR. Delineation of diseased tea patches using MXL and texture based classification. In Chen J, Jiang J, Nayak S, editors, XXIst ISPRS Congress: Silk road for information from imagery: Technical Commission IV, July 3-11, 2008 Beijing, China. Vol. Part B4. Beijing, China: International Society for Photogrammetry and Remote Sensing (ISPRS). 2008. p. 1693-1700

Delineation of diseased tea patches using MXL and texture based classification

Keywords

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