Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    11 Citations (Scopus)
    54 Downloads (Pure)

    Abstract

    Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC/IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time.
    Original languageUndefined
    Title of host publicationIEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010)
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages1-6
    Number of pages6
    ISBN (Print)978-1-4244-7792-0
    DOIs
    Publication statusPublished - 9 Jun 2010
    Event16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010 - La Grande Motte, France
    Duration: 7 Jun 20109 Jun 2010
    Conference number: 16

    Publication series

    Name
    PublisherIEEE Computer Society

    Workshop

    Workshop16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010
    Abbreviated titleIMS3TW
    CountryFrance
    CityLa Grande Motte
    Period7/06/109/06/10

    Keywords

    • METIS-277459
    • Dependability
    • Mixed-signal testing
    • Aging
    • Availability
    • IR-75047
    • CAES-TDT: Testable Design and Test
    • EWI-19004
    • self-calibration
    • self-repair
    • self-test
    • safety
    • Reliability

    Cite this