Dependence of silicon position-detector bandwidth on wavelength, power, and bias

J.H.G. Huisstede, Bart van Rooijen, Kees van der Werf, Martin L. Bennink, Vinod Subramaniam

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

We have developed a two-LED wobbler system to generate the spatial displacement of total light intensity on a detector surface, facilitating the acquisition of frequency responses up to 600 kHz with high accuracy. We have used this setup to characterize the low-pass filtering behavior of silicon-based position detectors for wavelengths above 850 nm by acquiring the frequency responses of several quadrant detectors and positionsensitive detectors as functions of wavelength, applied bias voltage, and total light power. We observed an increase in bandwidth for an increase in applied bias voltage and incident-light intensity. The combined effect of these parameters is strongly dependent on the detector used and has significant implications for the use of these detectors in scanning probe and optical tweezers applications.
Original languageUndefined
Pages (from-to)610-612
Number of pages3
JournalOptics letters
Volume31
Issue number5
DOIs
Publication statusPublished - 2006

Keywords

  • METIS-233866
  • IR-71719

Cite this

Huisstede, J. H. G., van Rooijen, B., van der Werf, K., Bennink, M. L., & Subramaniam, V. (2006). Dependence of silicon position-detector bandwidth on wavelength, power, and bias. Optics letters, 31(5), 610-612. https://doi.org/10.1364/OL.31.000610
Huisstede, J.H.G. ; van Rooijen, Bart ; van der Werf, Kees ; Bennink, Martin L. ; Subramaniam, Vinod. / Dependence of silicon position-detector bandwidth on wavelength, power, and bias. In: Optics letters. 2006 ; Vol. 31, No. 5. pp. 610-612.
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Huisstede, JHG, van Rooijen, B, van der Werf, K, Bennink, ML & Subramaniam, V 2006, 'Dependence of silicon position-detector bandwidth on wavelength, power, and bias', Optics letters, vol. 31, no. 5, pp. 610-612. https://doi.org/10.1364/OL.31.000610

Dependence of silicon position-detector bandwidth on wavelength, power, and bias. / Huisstede, J.H.G.; van Rooijen, Bart; van der Werf, Kees; Bennink, Martin L.; Subramaniam, Vinod.

In: Optics letters, Vol. 31, No. 5, 2006, p. 610-612.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Dependence of silicon position-detector bandwidth on wavelength, power, and bias

AU - Huisstede, J.H.G.

AU - van Rooijen, Bart

AU - van der Werf, Kees

AU - Bennink, Martin L.

AU - Subramaniam, Vinod

PY - 2006

Y1 - 2006

N2 - We have developed a two-LED wobbler system to generate the spatial displacement of total light intensity on a detector surface, facilitating the acquisition of frequency responses up to 600 kHz with high accuracy. We have used this setup to characterize the low-pass filtering behavior of silicon-based position detectors for wavelengths above 850 nm by acquiring the frequency responses of several quadrant detectors and positionsensitive detectors as functions of wavelength, applied bias voltage, and total light power. We observed an increase in bandwidth for an increase in applied bias voltage and incident-light intensity. The combined effect of these parameters is strongly dependent on the detector used and has significant implications for the use of these detectors in scanning probe and optical tweezers applications.

AB - We have developed a two-LED wobbler system to generate the spatial displacement of total light intensity on a detector surface, facilitating the acquisition of frequency responses up to 600 kHz with high accuracy. We have used this setup to characterize the low-pass filtering behavior of silicon-based position detectors for wavelengths above 850 nm by acquiring the frequency responses of several quadrant detectors and positionsensitive detectors as functions of wavelength, applied bias voltage, and total light power. We observed an increase in bandwidth for an increase in applied bias voltage and incident-light intensity. The combined effect of these parameters is strongly dependent on the detector used and has significant implications for the use of these detectors in scanning probe and optical tweezers applications.

KW - METIS-233866

KW - IR-71719

U2 - 10.1364/OL.31.000610

DO - 10.1364/OL.31.000610

M3 - Article

VL - 31

SP - 610

EP - 612

JO - Optics letters

JF - Optics letters

SN - 0146-9592

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