Design and Implementation of Test and Debug Features on Digital ICs using the Boundary Scan Interface

E. Jansen

Research output: Book/Report › Report › Professional

Keywords

TY - BOOK

T1 - Design and Implementation of Test and Debug Features on Digital ICs using the Boundary Scan Interface

AU - Jansen, E.

N1 - Philips Research, Eindhoven

PY - 1997

Y1 - 1997

KW - METIS-115961

M3 - Report

BT - Design and Implementation of Test and Debug Features on Digital ICs using the Boundary Scan Interface

PB - Signals and Systems (SAS)

CY - Enschede

ER -