| Original language | Undefined |
|---|---|
| Title of host publication | The test access port and boundary-scan architecture |
| Place of Publication | California |
| Publisher | IEEE |
| Pages | 333-343 |
| Number of pages | 0 |
| Publication status | Published - 1991 |
Keywords
- METIS-112472
R.P. van Riessen, Hans G. Kerkhoff
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic
| Original language | Undefined |
|---|---|
| Title of host publication | The test access port and boundary-scan architecture |
| Place of Publication | California |
| Publisher | IEEE |
| Pages | 333-343 |
| Number of pages | 0 |
| Publication status | Published - 1991 |