Design and performance of a Near Ultra High Vacuum Helium Ion Microscope

Raoul van Gastel; L. Barriss; C. Sanford; G. Hlawacek; L. Scipioni; A. Merkle; D. Voci; C. Fenner; Henricus J.W. Zandvliet; Bene Poelsema

doi:10.1017/S1431927611005514

Design and performance of a Near Ultra High Vacuum Helium Ion Microscope

Raoul van Gastel, L. Barriss, C. Sanford, G. Hlawacek, L. Scipioni, A. Merkle, D. Voci, C. Fenner, Henricus J.W. Zandvliet, Bene Poelsema

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Original language	Undefined
Pages (from-to)	928-929
Number of pages	2
Journal	Microscopy and microanalysis
Volume	17
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927611005514
Publication status	Published - 2011

Keywords

IR-104535
METIS-278021

Access to Document

10.1017/S1431927611005514

Cite this

@article{248578614fab497aaffa364bdcb3d923,

title = "Design and performance of a Near Ultra High Vacuum Helium Ion Microscope",

keywords = "IR-104535, METIS-278021",

author = "{van Gastel}, Raoul and L. Barriss and C. Sanford and G. Hlawacek and L. Scipioni and A. Merkle and D. Voci and C. Fenner and Zandvliet, {Henricus J.W.} and Bene Poelsema",

note = "Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011 ",

year = "2011",

doi = "10.1017/S1431927611005514",

language = "Undefined",

volume = "17",

pages = "928--929",

journal = "Microscopy and microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

}

TY - JOUR

T1 - Design and performance of a Near Ultra High Vacuum Helium Ion Microscope

AU - van Gastel, Raoul

AU - Barriss, L.

AU - Sanford, C.

AU - Hlawacek, G.

AU - Scipioni, L.

AU - Merkle, A.

AU - Voci, D.

AU - Fenner, C.

AU - Zandvliet, Henricus J.W.

AU - Poelsema, Bene

N1 - Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011

PY - 2011

Y1 - 2011

KW - IR-104535

KW - METIS-278021

U2 - 10.1017/S1431927611005514

DO - 10.1017/S1431927611005514

M3 - Article

SN - 1431-9276

VL - 17

SP - 928

EP - 929

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

IS - S2

ER -