Design for Delay Testability in High-Speed Digital ICs

Hans G. Kerkhoff, H. Speek, M Sashani, M. Sachdev

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined
Pages (from-to)	225-232
Number of pages	8
Journal	Journal of electronic testing
Volume	17
Issue number	3
Publication status	Published - 2001

Keywords

@article{3e752246968b475fbe8f13fe03e5e1e1,

title = "Design for Delay Testability in High-Speed Digital ICs",

keywords = "METIS-201757",

author = "Kerkhoff, {Hans G.} and H. Speek and M Sashani and M. Sachdev",

year = "2001",

language = "Undefined",

volume = "17",

pages = "225--232",

journal = "Journal of electronic testing",

issn = "0923-8174",

publisher = "Springer Netherlands",

number = "3",

}