Design for Testability

    Research output: Chapter in Book/Report/Conference proceedingChapterAcademic

    Original languageEnglish
    Title of host publicationAnalog VLSI
    Subtitle of host publicationSignal and Information Processing
    EditorsMohammed Ismail, Terri Fiez
    Place of PublicationNew York, NY
    PublisherMcgraw Hill
    Pages547-584
    ISBN (Print)0-07-032386-0
    Publication statusPublished - 1994

    Publication series

    NameMcGraw-Hill Series in Electrical & Computer Engineering
    PublisherMcGraw-Hill

    Keywords

    • METIS-112473

    Cite this