Design for Testability of Superconductor Electronics

A.J. Arun, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationAbstracts of International Superconductive Electronics Conference ISEC 2003
    Place of PublicationSydney, Autralia
    PagesPMo01-PMo02
    Number of pages2
    Publication statusPublished - 2003

    Keywords

    • METIS-215164

    Cite this