Design for Testability

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic

Original language	English
Title of host publication	Analog VLSI
Subtitle of host publication	Signal and Information Processing
Editors	Mohammed Ismail, Terri Fiez
Place of Publication	New York, NY
Publisher	Mcgraw Hill
Pages	547-584
ISBN (Print)	0-07-032386-0
Publication status	Published - 1994

Name	McGraw-Hill Series in Electrical & Computer Engineering
Publisher	McGraw-Hill

Keywords

@inbook{bb7f910f4f2241199f139352d5a1aaf3,

title = "Design for Testability",

keywords = "METIS-112473",

author = "Kerkhoff, \{Hans G.\}",

year = "1994",

language = "English",

isbn = "0-07-032386-0",

series = "McGraw-Hill Series in Electrical \& Computer Engineering",

publisher = "Mcgraw Hill",

pages = "547--584",

editor = "Mohammed Ismail and Terri Fiez",

booktitle = "Analog VLSI",

address = "United States",

}