Design of an Accelerated Humidity Test for the Evaluation of Flip-Chip Reliability

R. Oesterholt

    Research output: Book/ReportReportProfessional

    Original languageUndefined
    Place of PublicationEnschede
    PublisherSemiconductor Components (SC)
    Number of pages150
    Publication statusPublished - 1997

    Keywords

    • METIS-115969

    Cite this

    Oesterholt, R. (1997). Design of an Accelerated Humidity Test for the Evaluation of Flip-Chip Reliability. Enschede: Semiconductor Components (SC).