| Original language | Undefined |
|---|---|
| Place of Publication | Enschede |
| Publisher | Semiconductor Components (SC) |
| Number of pages | 150 |
| Publication status | Published - 1997 |
Keywords
- METIS-115969
Design of an Accelerated Humidity Test for the Evaluation of Flip-Chip Reliability
R. Oesterholt
Research output: Book/Report › Report › Professional