Design of an embedded health monitoring infrastructure for accessing multi-processor soc degradation

Hans G. Kerkhoff

doi:10.1109/DSD.2014.80

Design of an embedded health monitoring infrastructure for accessing multi-processor soc degradation

Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

8 Citations (Scopus)

7 Downloads (Pure)

Abstract

An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health- monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.

Original language	Undefined
Title of host publication	17th Euromicro Conference on Digital System Design (DSD)
Editors	Yong Zhao
Place of Publication	USA
Publisher	IEEE
Pages	154-160
Number of pages	7
ISBN (Print)	978-1-4799-5793-4
DOIs	https://doi.org/10.1109/DSD.2014.80
Publication status	Published - Aug 2014
Event	17th EUROMICRO Conference on Digital System Design, DSD 2014 - Verona, Italy Duration: 27 Aug 2014 → 29 Aug 2014 Conference number: 17

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	17th EUROMICRO Conference on Digital System Design, DSD 2014
Abbreviated title	DSD
Country/Territory	Italy
City	Verona
Period	27/08/14 → 29/08/14

Keywords

nano electronics
dependability testing
prognostics
EWI-25146
IR-92345
repair
MP-SoC
Health Monitoring
METIS-306061
reliability sensor

Access to Document

10.1109/DSD.2014.80

http://eprints.eemcs.utwente.nl/secure2/25146/01/Design_of_an_Embedded_Health_Monitoring_Infrastructure_for_Accessing_Multi-Processor_SoC_Degradation_final.pdf

Cite this

@inproceedings{c76770e38f5644e28f2e8605cd0bf3e0,

title = "Design of an embedded health monitoring infrastructure for accessing multi-processor soc degradation",

abstract = "An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health- monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.",

keywords = "nano electronics, dependability testing, prognostics, EWI-25146, IR-92345, repair, MP-SoC, Health Monitoring, METIS-306061, reliability sensor",

author = "Kerkhoff, {Hans G.}",

note = "10.1109/DSD.2014.80 ; 17th EUROMICRO Conference on Digital System Design, DSD 2014 ; Conference date: 27-08-2014 Through 29-08-2014",

year = "2014",

month = aug,

doi = "10.1109/DSD.2014.80",

language = "Undefined",

isbn = "978-1-4799-5793-4",

publisher = "IEEE",

pages = "154--160",

editor = "Yong Zhao",

booktitle = "17th Euromicro Conference on Digital System Design (DSD)",

address = "United States",

}

TY - GEN

T1 - Design of an embedded health monitoring infrastructure for accessing multi-processor soc degradation

AU - Kerkhoff, Hans G.

N1 - Conference code: 17

PY - 2014/8

Y1 - 2014/8

N2 - An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health- monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.

AB - An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health- monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.

KW - nano electronics

KW - dependability testing

KW - prognostics

KW - EWI-25146

KW - IR-92345

KW - repair

KW - MP-SoC

KW - Health Monitoring

KW - METIS-306061

KW - reliability sensor

U2 - 10.1109/DSD.2014.80

DO - 10.1109/DSD.2014.80

M3 - Conference contribution

SN - 978-1-4799-5793-4

SP - 154

EP - 160

BT - 17th Euromicro Conference on Digital System Design (DSD)

A2 - Zhao, Yong

PB - IEEE

CY - USA

T2 - 17th EUROMICRO Conference on Digital System Design, DSD 2014

Y2 - 27 August 2014 through 29 August 2014

ER -