Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration

E.X. Vrouwe, Albert van den Berg

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationMicro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems
EditorsM.A. Northrup, K.F Jensen, D.J. Harrison
Place of PublicationOhio
PublisherTransducers Research Foundation, Inc.
Pages89-92
Number of pages4
ISBN (Print)0-9743611-0-0
Publication statusPublished - 5 Oct 2003
Event7th International Symposium on Micro Total Analysis Systems, μTAS 2003 - Squaw Valley, United States
Duration: 5 Oct 20039 Oct 2003
Conference number: 7

Conference

Conference7th International Symposium on Micro Total Analysis Systems, μTAS 2003
Abbreviated titleMicroTAS
CountryUnited States
CitySquaw Valley
Period5/10/039/10/03

Keywords

  • IR-46474
  • METIS-215090

Cite this

Vrouwe, E. X., & van den Berg, A. (2003). Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration. In M. A. Northrup, K. F. Jensen, & D. J. Harrison (Eds.), Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems (pp. 89-92). Ohio: Transducers Research Foundation, Inc..
Vrouwe, E.X. ; van den Berg, Albert. / Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration. Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems. editor / M.A. Northrup ; K.F Jensen ; D.J. Harrison. Ohio : Transducers Research Foundation, Inc., 2003. pp. 89-92
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title = "Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration",
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author = "E.X. Vrouwe and {van den Berg}, Albert",
year = "2003",
month = "10",
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language = "English",
isbn = "0-9743611-0-0",
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Vrouwe, EX & van den Berg, A 2003, Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration. in MA Northrup, KF Jensen & DJ Harrison (eds), Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems. Transducers Research Foundation, Inc., Ohio, pp. 89-92, 7th International Symposium on Micro Total Analysis Systems, μTAS 2003, Squaw Valley, United States, 5/10/03.

Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration. / Vrouwe, E.X.; van den Berg, Albert.

Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems. ed. / M.A. Northrup; K.F Jensen; D.J. Harrison. Ohio : Transducers Research Foundation, Inc., 2003. p. 89-92.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration

AU - Vrouwe, E.X.

AU - van den Berg, Albert

PY - 2003/10/5

Y1 - 2003/10/5

KW - IR-46474

KW - METIS-215090

M3 - Conference contribution

SN - 0-9743611-0-0

SP - 89

EP - 92

BT - Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems

A2 - Northrup, M.A.

A2 - Jensen, K.F

A2 - Harrison, D.J.

PB - Transducers Research Foundation, Inc.

CY - Ohio

ER -

Vrouwe EX, van den Berg A. Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration. In Northrup MA, Jensen KF, Harrison DJ, editors, Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems. Ohio: Transducers Research Foundation, Inc. 2003. p. 89-92