Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration

E.X. Vrouwe, Albert van den Berg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationMicro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems
    EditorsM.A. Northrup, K.F Jensen, D.J. Harrison
    Place of PublicationOhio
    PublisherTransducers Research Foundation, Inc.
    Pages89-92
    Number of pages4
    ISBN (Print)0-9743611-0-0
    Publication statusPublished - 5 Oct 2003
    Event7th International Symposium on Micro Total Analysis Systems, μTAS 2003 - Squaw Valley, United States
    Duration: 5 Oct 20039 Oct 2003
    Conference number: 7

    Conference

    Conference7th International Symposium on Micro Total Analysis Systems, μTAS 2003
    Abbreviated titleMicroTAS
    CountryUnited States
    CitySquaw Valley
    Period5/10/039/10/03

    Keywords

    • IR-46474
    • METIS-215090

    Cite this

    Vrouwe, E. X., & van den Berg, A. (2003). Destacking loading conditions on a CE chip for measuring samples with a high matrix concentration. In M. A. Northrup, K. F. Jensen, & D. J. Harrison (Eds.), Micro Toral Analysis Systems; seventh International Conference on Micro Total Analysis Systems (pp. 89-92). Ohio: Transducers Research Foundation, Inc..