Detailed analysis of the intracavity phenomena inside a cylindrical microresonator

D.J.W. Klunder; M.L.M. Balistreri; F.C. Blom; Hugo Hoekstra; A. Driessen; L. Kuipers; N.F. van Hulst

doi:10.1109/50.989003

Detailed analysis of the intracavity phenomena inside a cylindrical microresonator

D.J.W. Klunder, M.L.M. Balistreri, F.C. Blom, Hugo Hoekstra, A. Driessen, L. Kuipers, N.F. van Hulst

Optical Sciences

Research output: Contribution to journal › Article › Academic › peer-review

18 Citations (Scopus)

151 Downloads (Pure)

Abstract

Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found.

Original language	English
Pages (from-to)	519-529
Number of pages	11
Journal	Journal of lightwave technology
Volume	20
Issue number	3
DOIs	https://doi.org/10.1109/50.989003
Publication status	Published - 2002

Access to Document

10.1109/50.989003

Cite this

@article{5e570d4b8698438c97f47005b84dd25c,

title = "Detailed analysis of the intracavity phenomena inside a cylindrical microresonator",

abstract = "Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found.",

author = "D.J.W. Klunder and M.L.M. Balistreri and F.C. Blom and Hugo Hoekstra and A. Driessen and L. Kuipers and {van Hulst}, N.F.",

year = "2002",

doi = "10.1109/50.989003",

language = "English",

volume = "20",

pages = "519--529",

journal = "Journal of lightwave technology",

issn = "0733-8724",

publisher = "IEEE",

number = "3",

}

TY - JOUR

T1 - Detailed analysis of the intracavity phenomena inside a cylindrical microresonator

AU - Klunder, D.J.W.

AU - Balistreri, M.L.M.

AU - Blom, F.C.

AU - Hoekstra, Hugo

AU - Driessen, A.

AU - Kuipers, L.

AU - van Hulst, N.F.

PY - 2002

Y1 - 2002

N2 - Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found.

AB - Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found.

U2 - 10.1109/50.989003

DO - 10.1109/50.989003

M3 - Article

SN - 0733-8724

VL - 20

SP - 519

EP - 529

JO - Journal of lightwave technology

JF - Journal of lightwave technology

IS - 3

ER -

Detailed analysis of the intracavity phenomena inside a cylindrical microresonator

Abstract

Access to Document

Fingerprint

Cite this