Detailed characterization of supported eutectic droplets using photoemission electron microscopy

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Abstract

Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the experimental electron emission profile. The local inclination of the droplets' surface plays a decisive role in the generated emission profile. Intensity variations at the illuminated side of the eutectic droplets are a consequence of standing waves in the electromagnetic field responsible for excitation. Intensity variations at the nonilluminated side are ascribed to a diffraction pattern of the photons after their interaction with the droplet.

Original languageEnglish
Article number105601
JournalPhysical Review Materials
Volume5
Issue number10
DOIs
Publication statusPublished - Oct 2021

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