Detailed characterization of supported eutectic droplets using photoemission electron microscopy

Zhiguo Zhang; Bene Poelsema; Harold J.W. Zandvliet; Arie van Houselt

doi:10.1103/PhysRevMaterials.5.105601

Detailed characterization of supported eutectic droplets using photoemission electron microscopy

Zhiguo Zhang, Bene Poelsema, Harold J.W. Zandvliet, Arie van Houselt

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Abstract

Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the experimental electron emission profile. The local inclination of the droplets' surface plays a decisive role in the generated emission profile. Intensity variations at the illuminated side of the eutectic droplets are a consequence of standing waves in the electromagnetic field responsible for excitation. Intensity variations at the nonilluminated side are ascribed to a diffraction pattern of the photons after their interaction with the droplet.

Original language	English
Article number	105601
Journal	Physical Review Materials
Volume	5
Issue number	10
DOIs	https://doi.org/10.1103/PhysRevMaterials.5.105601
Publication status	Published - Oct 2021

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title = "Detailed characterization of supported eutectic droplets using photoemission electron microscopy",

abstract = "Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the experimental electron emission profile. The local inclination of the droplets' surface plays a decisive role in the generated emission profile. Intensity variations at the illuminated side of the eutectic droplets are a consequence of standing waves in the electromagnetic field responsible for excitation. Intensity variations at the nonilluminated side are ascribed to a diffraction pattern of the photons after their interaction with the droplet.",

author = "Zhiguo Zhang and Bene Poelsema and Zandvliet, {Harold J.W.} and {van Houselt}, Arie",

note = "Funding Information: China Scholarship Council Nederlandse Organisatie voor Wetenschappelijk Onderzoek Funding Information: Z.Z. thanks the China Scholarship Council (CSC 201708130089) for financial support. H.J.W.Z. and A.v.H. acknowledge the Nederlandse organisatie voor Wetenschappelijk Onderzoek (NWO) for financial support. Publisher Copyright: {\textcopyright} 2021 American Physical Society",

year = "2021",

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doi = "10.1103/PhysRevMaterials.5.105601",

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AU - Zhang, Zhiguo

AU - Poelsema, Bene

AU - Zandvliet, Harold J.W.

AU - van Houselt, Arie

N1 - Funding Information: China Scholarship Council Nederlandse Organisatie voor Wetenschappelijk Onderzoek Funding Information: Z.Z. thanks the China Scholarship Council (CSC 201708130089) for financial support. H.J.W.Z. and A.v.H. acknowledge the Nederlandse organisatie voor Wetenschappelijk Onderzoek (NWO) for financial support. Publisher Copyright: © 2021 American Physical Society

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N2 - Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the experimental electron emission profile. The local inclination of the droplets' surface plays a decisive role in the generated emission profile. Intensity variations at the illuminated side of the eutectic droplets are a consequence of standing waves in the electromagnetic field responsible for excitation. Intensity variations at the nonilluminated side are ascribed to a diffraction pattern of the photons after their interaction with the droplet.

AB - Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the experimental electron emission profile. The local inclination of the droplets' surface plays a decisive role in the generated emission profile. Intensity variations at the illuminated side of the eutectic droplets are a consequence of standing waves in the electromagnetic field responsible for excitation. Intensity variations at the nonilluminated side are ascribed to a diffraction pattern of the photons after their interaction with the droplet.

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Detailed characterization of supported eutectic droplets using photoemission electron microscopy

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