Detecting intermittent resistive faults in digital CMOS circuits

Hassan Ebrahimi; Hans G. Kerkhoff; A. Rohani

doi:10.1109/DFT.2016.7684075

Detecting intermittent resistive faults in digital CMOS circuits

Hassan Ebrahimi, Hans G. Kerkhoff, A. Rohani

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

8 Citations (Scopus)

Abstract

Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

Original language	Undefined
Title of host publication	IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Place of Publication	USA
Publisher	IEEE
Pages	87-90
Number of pages	4
ISBN (Print)	978-1-5090-3623-3
DOIs	https://doi.org/10.1109/DFT.2016.7684075
Publication status	Published - 27 Oct 2016
Event	2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 - University of Connecticut, Storrs, United States Duration: 19 Sep 2016 → 20 Sep 2016

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Abbreviated title	DFT
Country/Territory	United States
City	Storrs
Period	19/09/16 → 20/09/16

Keywords

CAES-TDT: Testable Design and Test
EC Grant Agreement nr.: FP7/619871
EWI-27610
METIS-321678
intermittent fault
No Fault Found
IR-103192

Access to Document

10.1109/DFT.2016.7684075

Cite this

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title = "Detecting intermittent resistive faults in digital CMOS circuits",

abstract = "Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.",

keywords = "CAES-TDT: Testable Design and Test, EC Grant Agreement nr.: FP7/619871, EWI-27610, METIS-321678, intermittent fault, No Fault Found, IR-103192",

author = "Hassan Ebrahimi and Kerkhoff, {Hans G.} and A. Rohani",

note = "10.1109/DFT.2016.7684075 ; null ; Conference date: 19-09-2016 Through 20-09-2016",

year = "2016",

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doi = "10.1109/DFT.2016.7684075",

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booktitle = "IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)",

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Ebrahimi, H, Kerkhoff, HG & Rohani, A 2016, Detecting intermittent resistive faults in digital CMOS circuits. in IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, USA, pp. 87-90, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, Connecticut, United States, 19/09/16. https://doi.org/10.1109/DFT.2016.7684075

TY - GEN

T1 - Detecting intermittent resistive faults in digital CMOS circuits

AU - Ebrahimi, Hassan

AU - Kerkhoff, Hans G.

AU - Rohani, A.

N1 - 10.1109/DFT.2016.7684075

PY - 2016/10/27

Y1 - 2016/10/27

N2 - Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

AB - Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

KW - CAES-TDT: Testable Design and Test

KW - EC Grant Agreement nr.: FP7/619871

KW - EWI-27610

KW - METIS-321678

KW - intermittent fault

KW - No Fault Found

KW - IR-103192

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DO - 10.1109/DFT.2016.7684075

M3 - Conference contribution

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EP - 90

BT - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

PB - IEEE

CY - USA

Y2 - 19 September 2016 through 20 September 2016

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