Detecting intermittent resistive faults in digital CMOS circuits

Hassan Ebrahimi, Hans G. Kerkhoff, A. Rohani

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)

Abstract

Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.
Original languageUndefined
Title of host publicationIEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Place of PublicationUSA
PublisherIEEE Computer Society
Pages87-90
Number of pages4
ISBN (Print)978-1-5090-3623-3
DOIs
Publication statusPublished - 27 Oct 2016
Event2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 - University of Connecticut, Storrs, United States
Duration: 19 Sep 201620 Sep 2016

Publication series

Name
PublisherIEEE Computer Society

Conference

Conference2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Abbreviated titleDFT
CountryUnited States
CityStorrs
Period19/09/1620/09/16

Keywords

  • CAES-TDT: Testable Design and Test
  • EC Grant Agreement nr.: FP7/619871
  • EWI-27610
  • METIS-321678
  • intermittent fault
  • No Fault Found
  • IR-103192

Cite this

Ebrahimi, H., Kerkhoff, H. G., & Rohani, A. (2016). Detecting intermittent resistive faults in digital CMOS circuits. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 87-90). USA: IEEE Computer Society. https://doi.org/10.1109/DFT.2016.7684075
Ebrahimi, Hassan ; Kerkhoff, Hans G. ; Rohani, A. / Detecting intermittent resistive faults in digital CMOS circuits. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). USA : IEEE Computer Society, 2016. pp. 87-90
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abstract = "Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.",
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Ebrahimi, H, Kerkhoff, HG & Rohani, A 2016, Detecting intermittent resistive faults in digital CMOS circuits. in IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE Computer Society, USA, pp. 87-90, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, United States, 19/09/16. https://doi.org/10.1109/DFT.2016.7684075

Detecting intermittent resistive faults in digital CMOS circuits. / Ebrahimi, Hassan; Kerkhoff, Hans G.; Rohani, A.

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). USA : IEEE Computer Society, 2016. p. 87-90.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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T1 - Detecting intermittent resistive faults in digital CMOS circuits

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Y1 - 2016/10/27

N2 - Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

AB - Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

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Ebrahimi H, Kerkhoff HG, Rohani A. Detecting intermittent resistive faults in digital CMOS circuits. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). USA: IEEE Computer Society. 2016. p. 87-90 https://doi.org/10.1109/DFT.2016.7684075