Detecting intermittent resistive faults in digital CMOS circuits

Hassan Ebrahimi, Hans G. Kerkhoff, A. Rohani

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    7 Citations (Scopus)

    Abstract

    Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.
    Original languageUndefined
    Title of host publicationIEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages87-90
    Number of pages4
    ISBN (Print)978-1-5090-3623-3
    DOIs
    Publication statusPublished - 27 Oct 2016
    Event2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 - University of Connecticut, Storrs, United States
    Duration: 19 Sep 201620 Sep 2016

    Publication series

    Name
    PublisherIEEE Computer Society

    Conference

    Conference2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
    Abbreviated titleDFT
    CountryUnited States
    CityStorrs
    Period19/09/1620/09/16

    Keywords

    • CAES-TDT: Testable Design and Test
    • EC Grant Agreement nr.: FP7/619871
    • EWI-27610
    • METIS-321678
    • intermittent fault
    • No Fault Found
    • IR-103192

    Cite this

    Ebrahimi, H., Kerkhoff, H. G., & Rohani, A. (2016). Detecting intermittent resistive faults in digital CMOS circuits. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 87-90). USA: IEEE Computer Society. https://doi.org/10.1109/DFT.2016.7684075