Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard

Hans G. Kerkhoff; Hassan  Ebrahimi

doi:10.1109/ACQED.2015.7274011

Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard

Hans G. Kerkhoff, Hassan Ebrahimi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

7 Citations (Scopus)

5 Downloads (Pure)

Abstract

In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished.

Original language	English
Title of host publication	2015 6th Asia Symposium on Quality Electronic Design (ASQED 2015)
Subtitle of host publication	Kuala Lumpur, Malaysia, 4-5 August 2015
Place of Publication	Piscataway, NJ
Publisher	IEEE
Pages	77-82
Number of pages	6
ISBN (Print)	978-1-4673-7495-8
DOIs	https://doi.org/10.1109/ACQED.2015.7274011
Publication status	Published - 6 Aug 2015
Event	6th Asia Symposium on Quality Electronic Design, ASQED 2015 - Kuala Lumpur, Malaysia Duration: 4 Aug 2015 → 5 Aug 2015 Conference number: 6

Conference

Conference	6th Asia Symposium on Quality Electronic Design, ASQED 2015
Abbreviated title	ASQED
Country/Territory	Malaysia
City	Kuala Lumpur
Period	4/08/15 → 5/08/15

Keywords

EC Grant Agreement nr.: FP7/619871
EWI-26208
CAES-TDT: Testable Design and Test
Reliability
IR-99598
Mixed-Signal test
METIS-316021
Dependability
Intermittent Resistive Faults
No Faults Found
Boundary-Scan
Evoking & Detection of faults
IEEE 1149.4

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10.1109/ACQED.2015.7274011

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@inproceedings{29d040e5811a4384a6e08808bed0a6e2,

title = "Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard",

abstract = "In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished.",

keywords = "EC Grant Agreement nr.: FP7/619871, EWI-26208, CAES-TDT: Testable Design and Test, Reliability, IR-99598, Mixed-Signal test, METIS-316021, Dependability, Intermittent Resistive Faults, No Faults Found, Boundary-Scan, Evoking & Detection of faults, IEEE 1149.4",

author = "Kerkhoff, {Hans G.} and Hassan Ebrahimi",

note = "eemcs-eprint-26208 ; 6th Asia Symposium on Quality Electronic Design, ASQED 2015, ASQED ; Conference date: 04-08-2015 Through 05-08-2015",

year = "2015",

month = aug,

day = "6",

doi = "10.1109/ACQED.2015.7274011",

language = "English",

isbn = "978-1-4673-7495-8",

pages = "77--82",

booktitle = "2015 6th Asia Symposium on Quality Electronic Design (ASQED 2015)",

publisher = "IEEE",

address = "United States",

}

Kerkhoff, HG & Ebrahimi, H 2015, Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard. in 2015 6th Asia Symposium on Quality Electronic Design (ASQED 2015): Kuala Lumpur, Malaysia, 4-5 August 2015. IEEE, Piscataway, NJ, pp. 77-82, 6th Asia Symposium on Quality Electronic Design, ASQED 2015, Kuala Lumpur, Malaysia, 4/08/15. https://doi.org/10.1109/ACQED.2015.7274011

Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard. / Kerkhoff, Hans G.; Ebrahimi, Hassan .
2015 6th Asia Symposium on Quality Electronic Design (ASQED 2015): Kuala Lumpur, Malaysia, 4-5 August 2015. Piscataway, NJ: IEEE, 2015. p. 77-82.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard

AU - Kerkhoff, Hans G.

AU - Ebrahimi, Hassan

N1 - Conference code: 6

PY - 2015/8/6

Y1 - 2015/8/6

N2 - In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished.

AB - In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished.

KW - EC Grant Agreement nr.: FP7/619871

KW - EWI-26208

KW - CAES-TDT: Testable Design and Test

KW - Reliability

KW - IR-99598

KW - Mixed-Signal test

KW - METIS-316021

KW - Dependability

KW - Intermittent Resistive Faults

KW - No Faults Found

KW - Boundary-Scan

KW - Evoking & Detection of faults

KW - IEEE 1149.4

U2 - 10.1109/ACQED.2015.7274011

DO - 10.1109/ACQED.2015.7274011

M3 - Conference contribution

SN - 978-1-4673-7495-8

SP - 77

EP - 82

BT - 2015 6th Asia Symposium on Quality Electronic Design (ASQED 2015)

PB - IEEE

CY - Piscataway, NJ

T2 - 6th Asia Symposium on Quality Electronic Design, ASQED 2015

Y2 - 4 August 2015 through 5 August 2015

ER -

Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard

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Keywords

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