Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard

Hans G. Kerkhoff, Hassan Ebrahimi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    7 Citations (Scopus)

    Abstract

    In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished.
    Original languageEnglish
    Title of host publication2015 6th Asia Symposium on Quality Electronic Design (ASQED 2015)
    Subtitle of host publicationKuala Lumpur, Malaysia, 4-5 August 2015
    Place of PublicationPiscataway, NJ
    PublisherIEEE Circuits & Systems Society
    Pages77-82
    Number of pages6
    ISBN (Print)978-1-4673-7495-8
    DOIs
    Publication statusPublished - 6 Aug 2015
    Event6th Asia Symposium on Quality Electronic Design, ASQED 2015 - Kuala Lumpur, Malaysia
    Duration: 4 Aug 20155 Aug 2015
    Conference number: 6

    Conference

    Conference6th Asia Symposium on Quality Electronic Design, ASQED 2015
    Abbreviated titleASQED
    CountryMalaysia
    CityKuala Lumpur
    Period4/08/155/08/15

    Keywords

    • EC Grant Agreement nr.: FP7/619871
    • EWI-26208
    • CAES-TDT: Testable Design and Test
    • Reliability
    • IR-99598
    • Mixed-Signal test
    • METIS-316021
    • Dependability
    • Intermittent Resistive Faults
    • No Faults Found
    • Boundary-Scan
    • Evoking & Detection of faults
    • IEEE 1149.4

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