Determination of bit patterned media noise based on island perimeter fluctuations

Laurens Alink, J.P.J. Groenland, Jeroen de Vries, Leon Abelmann

    Research output: Contribution to journalArticleAcademicpeer-review

    Abstract

    We measured the fluctuation in shape of magnetic islands in bit patterned media fabricated by laser interference lithography. This fluctuation can be accurately described by a model based on a Fourier series expansion of the perimeter of the islands. The model can be easily linked to amplitude and jitter noise. We show that the amplitude and jitter noise are in principle correlated, and the jitter noise increases with increasing island area. The correlation is small for media prepared by laser interference lithography, but expected to gain importance for high density bit patterned media.
    Original languageUndefined
    Pages (from-to)4574-4577
    Number of pages4
    JournalIEEE transactions on magnetics
    Volume48
    Issue number11
    DOIs
    Publication statusPublished - Nov 2012
    EventIEEE International Magnetics Conference, INTERMAG 2012 - Vancouver, Canada
    Duration: 7 May 201211 May 2012

    Keywords

    • EWI-22489
    • laser interference lithography
    • media noise
    • Channel modeling
    • METIS-289773
    • IR-82155
    • magnetic bit patterned media

    Cite this