Determination of the aging offset voltage of AMR sensors based on accelerated degradation test

A.C. Zambrano Constantini, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review


    Usually Anisotropic Magnetoresistance angle sensors are configured with two Wheatstone bridges, but an undesirable offset voltage included in the sensor output affects its accuracy. The total offset voltage combines a voltage due to resistance mismatches during manufacturing and a voltage from inequalities in the magnetic sensitivity. This paper focuses on identifying a consistent trend between the bridges' offset voltages. Compared with previous studies that focus on lifetime tests using high temperatures, this research uses temperature cycling to study offset voltage and sensitivity variations due to aging effects. A consistent trend between the bridges' offset voltages could not be found. The two offset components can add to or subtract from each other and their interaction can change over time due to variations in the sensor's material properties. To achieve a precise angle measurement, the offset voltage must be compensated continuously over the entire sensor lifetime.
    Original languageUndefined
    Title of host publication20th International Mixed-Signal Testing Workshop, IMSTW 2015
    Place of PublicationUSA
    Number of pages5
    ISBN (Print)978-1-4673-6732-5
    Publication statusPublished - Jun 2015
    Event2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015 - Paris, France
    Duration: 24 Jun 201526 Jun 2015
    Conference number: 20

    Publication series



    Workshop2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015
    Abbreviated titleIMSTW


    • EWI-26232
    • offset voltage
    • METIS-312702
    • IR-96850
    • AMR angle sensor
    • degradation test

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