Determination of the aging offset voltage of AMR sensors based on accelerated degradation test

A.C. Zambrano Constantini; Hans G. Kerkhoff

doi:10.1109/IMS3TW.2015.7177871

Determination of the aging offset voltage of AMR sensors based on accelerated degradation test

A.C. Zambrano Constantini, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

Usually Anisotropic Magnetoresistance angle sensors are configured with two Wheatstone bridges, but an undesirable offset voltage included in the sensor output affects its accuracy. The total offset voltage combines a voltage due to resistance mismatches during manufacturing and a voltage from inequalities in the magnetic sensitivity. This paper focuses on identifying a consistent trend between the bridges' offset voltages. Compared with previous studies that focus on lifetime tests using high temperatures, this research uses temperature cycling to study offset voltage and sensitivity variations due to aging effects. A consistent trend between the bridges' offset voltages could not be found. The two offset components can add to or subtract from each other and their interaction can change over time due to variations in the sensor's material properties. To achieve a precise angle measurement, the offset voltage must be compensated continuously over the entire sensor lifetime.

Original language	Undefined
Title of host publication	20th International Mixed-Signal Testing Workshop, IMSTW 2015
Place of Publication	USA
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4673-6732-5
DOIs	https://doi.org/10.1109/IMS3TW.2015.7177871
Publication status	Published - Jun 2015
Event	2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015 - Paris, France Duration: 24 Jun 2015 → 26 Jun 2015 Conference number: 20

Publication series

Name
Publisher	IEEE

Workshop

Workshop	2015 IEEE 20th International Mixed-Signals Testing Workshop, IMSTW 2015
Abbreviated title	IMSTW
Country/Territory	France
City	Paris
Period	24/06/15 → 26/06/15

Keywords

EWI-26232
offset voltage
METIS-312702
IR-96850
AMR angle sensor
degradation test

Access to Document

10.1109/IMS3TW.2015.7177871

http://eprints.eemcs.utwente.nl/secure2/26232/01/ieee_explorer_version.pdf

Cite this

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title = "Determination of the aging offset voltage of AMR sensors based on accelerated degradation test",

abstract = "Usually Anisotropic Magnetoresistance angle sensors are configured with two Wheatstone bridges, but an undesirable offset voltage included in the sensor output affects its accuracy. The total offset voltage combines a voltage due to resistance mismatches during manufacturing and a voltage from inequalities in the magnetic sensitivity. This paper focuses on identifying a consistent trend between the bridges' offset voltages. Compared with previous studies that focus on lifetime tests using high temperatures, this research uses temperature cycling to study offset voltage and sensitivity variations due to aging effects. A consistent trend between the bridges' offset voltages could not be found. The two offset components can add to or subtract from each other and their interaction can change over time due to variations in the sensor's material properties. To achieve a precise angle measurement, the offset voltage must be compensated continuously over the entire sensor lifetime.",

keywords = "EWI-26232, offset voltage, METIS-312702, IR-96850, AMR angle sensor, degradation test",

author = "{Zambrano Constantini}, A.C. and Kerkhoff, {Hans G.}",

note = "10.1109/IMS3TW.2015.7177871 ; null ; Conference date: 24-06-2015 Through 26-06-2015",

year = "2015",

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doi = "10.1109/IMS3TW.2015.7177871",

language = "Undefined",

isbn = "978-1-4673-6732-5",

publisher = "IEEE",

pages = "1--5",

booktitle = "20th International Mixed-Signal Testing Workshop, IMSTW 2015",

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TY - GEN

T1 - Determination of the aging offset voltage of AMR sensors based on accelerated degradation test

AU - Zambrano Constantini, A.C.

AU - Kerkhoff, Hans G.

N1 - Conference code: 20

PY - 2015/6

Y1 - 2015/6

N2 - Usually Anisotropic Magnetoresistance angle sensors are configured with two Wheatstone bridges, but an undesirable offset voltage included in the sensor output affects its accuracy. The total offset voltage combines a voltage due to resistance mismatches during manufacturing and a voltage from inequalities in the magnetic sensitivity. This paper focuses on identifying a consistent trend between the bridges' offset voltages. Compared with previous studies that focus on lifetime tests using high temperatures, this research uses temperature cycling to study offset voltage and sensitivity variations due to aging effects. A consistent trend between the bridges' offset voltages could not be found. The two offset components can add to or subtract from each other and their interaction can change over time due to variations in the sensor's material properties. To achieve a precise angle measurement, the offset voltage must be compensated continuously over the entire sensor lifetime.

AB - Usually Anisotropic Magnetoresistance angle sensors are configured with two Wheatstone bridges, but an undesirable offset voltage included in the sensor output affects its accuracy. The total offset voltage combines a voltage due to resistance mismatches during manufacturing and a voltage from inequalities in the magnetic sensitivity. This paper focuses on identifying a consistent trend between the bridges' offset voltages. Compared with previous studies that focus on lifetime tests using high temperatures, this research uses temperature cycling to study offset voltage and sensitivity variations due to aging effects. A consistent trend between the bridges' offset voltages could not be found. The two offset components can add to or subtract from each other and their interaction can change over time due to variations in the sensor's material properties. To achieve a precise angle measurement, the offset voltage must be compensated continuously over the entire sensor lifetime.

KW - EWI-26232

KW - offset voltage

KW - METIS-312702

KW - IR-96850

KW - AMR angle sensor

KW - degradation test

U2 - 10.1109/IMS3TW.2015.7177871

DO - 10.1109/IMS3TW.2015.7177871

M3 - Conference contribution

SN - 978-1-4673-6732-5

SP - 1

EP - 5

BT - 20th International Mixed-Signal Testing Workshop, IMSTW 2015

PB - IEEE

CY - USA

Y2 - 24 June 2015 through 26 June 2015

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