Determination of the relative concentrations of rare earth ions by x-ray absorption spectroscopy: Application to terbium mixed oxides

G. van der Laan, J.C. Fuggle, M.P. van Dijk, A.J. Burggraaf, J.-M. Esteva, R. Karnatak

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Abstract

A method, based on X-ray absorption spectroscopy (XAS) in the range 0.8–1.5 keV, to determine the relative amounts of rare earth ions in different valencies is explained and tested for the case of terbium mixed oxides. The results are in agreement with those obtained by existing analytical methods. The XAS method is advantageous in that it can be applied where other, conventional, methods break down.
Original languageEnglish
Pages (from-to)413-416
JournalJournal of physics and chemistry of solids
Volume47
Issue number4
DOIs
Publication statusPublished - 1986

Keywords

  • Mixed valence
  • Rare earths
  • Ionic conductivity
  • X-ray absorption
  • Oxides
  • Terbium

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