Determination of thickness and dielectric constant of thin transparent dielectric layers using Surface Plasmon Resonance

H.E. de Bruijn, Helene E. de Bruijn, Bert S.F. Altenburg, R.P.H. Kooyman, Jan Greve

Research output: Contribution to journalArticleAcademicpeer-review

143 Citations (Scopus)
783 Downloads (Pure)

Abstract

The determination of the thickness and dielectric constant of thin dielectric layers by means of surface plasmon resonance is discussed. It appears to be impossible to determine these parameters from one surface plasmon response experiment. This is illustrated theoretically. Variation of the refractive index of the solution in which surface plasmon experiments were performed allowed us to determine these parameters separately.
Original languageUndefined
Pages (from-to)425-432
Number of pages8
JournalOptics communications
Volume82
Issue number5,6
DOIs
Publication statusPublished - 1991

Keywords

  • METIS-129441
  • IR-72953

Cite this