Determination of thickness and dielectric constant of thin transparent dielectric layers using Surface Plasmon Resonance

H.E. de Bruijn, Helene E. de Bruijn, Bert S.F. Altenburg, R.P.H. Kooyman, Jan Greve

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The determination of the thickness and dielectric constant of thin dielectric layers by means of surface plasmon resonance is discussed. It appears to be impossible to determine these parameters from one surface plasmon response experiment. This is illustrated theoretically. Variation of the refractive index of the solution in which surface plasmon experiments were performed allowed us to determine these parameters separately.
Original languageUndefined
Pages (from-to)425-432
Number of pages8
JournalOptics communications
Issue number5,6
Publication statusPublished - 1991


  • METIS-129441
  • IR-72953

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