Determining the local density of states in the constant current STM mode

Chris Hellenthal, Rene Heimbuch, Kai Sotthewes, Ernst S. Kooij, Henricus J.W. Zandvliet

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Abstract

We present an alternative scheme to determine the local density of states (LDOS) of a sample using data obtained via scanning tunneling spectroscopy (STS). Using either the tunneling current as a function of applied bias voltage or the tip-sample separation as a function of applied bias voltage, the LDOS can be determined via a numerical fitting algorithm. This fitting algorithm makes use of the one-dimensional Simmons tunnel barrier model without introducing any further mathematical approximations. By ways of a simulated LDOS, the proposed method is compared to existing LDOS extraction methods for both positive and negative biases, and the differences between the methods are discussed
Original languageEnglish
Article number035425
Pages (from-to)-
Number of pages6
JournalPhysical review B: Condensed matter and materials physics
Volume88
Issue number3
DOIs
Publication statusPublished - 2013

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Keywords

  • METIS-298053
  • IR-89991

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