Development of an integrated NSOM probe

A.G.T. Ruiter, M.H.P. Moers, A. Jalocha, N.F. van Hulst

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A new type of NSOM probe has been developed, with a design based o­n the probes used in Atomic Force Microscopy. The probe consists of a cantilever with at its end a conical tip. This tip has been metal-coated to provide an aperture. With the cantilevered probe, the problem of breaking of the tip due to high normal forces is solved. In operation, the tip is scanned in contact with the sample while regulating the force between the tip and the sample with a beam deflection technique, which allows to simultaneously make an optical and a topographical image of the sample. The probes are made using micromechanical techniques, which allows batch fabrication of the probes. Testing of the probes is done in a transmission NSOM set-up in which the sample is scanned while the tip and the optical path are kept fixed. Using an opaque sample with submicron holes, the new probes have been tested, resulting an optical image with a simultaneously measured topographical image.
Original languageEnglish
Pages (from-to)139-143
Number of pages5
Issue number1-4
Publication statusPublished - 1995
Event3rd International Conference on Near-Field Optics, NFO-3 1995 - Brno, Czech Republic
Duration: 9 May 199511 May 1995
Conference number: 3


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