Development of Cryogenic Current Comparators with DC Squid Readout for the Calibration of Electrical Standards

L. Vargas, G.C.S. Brons, B. Bouverat, J. Flokstra, H. Rogalla, G. Rietveld, C. Rillo, J. Sesé, A. Camon, W. Jaszczuk, H. Altenburg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    18 Citations (Scopus)

    Abstract

    For the realization of the electrical quantum metrology triangle (V-A-Ω) a device to amplify very small currents with high precision is needed. The cryogenic current comparator (CCC) is by far the best instrument to do this. In order to make a very current sensitive CCC for calibration of electrical standards, we have developed optimum dc Superconducting QUantum Interference Devices (SQUIDs). The design, fabrication and characterisation of these devices is presented. The measurements concern the flux-to-voltage transfer and the noise properties, especially the input current noise. The optimisation of the flux transformer circuit that links the CCC with the SQUID will be treated. In addition, typical fabrication aspects of the CCC as the wires and tube assembly, the shields and the support system will be addressed.
    Original languageEnglish
    Title of host publicationSensor technology in the Netherlands - state of the art
    Subtitle of host publicationproceedings of the Dutch Sensor Conference, 2-3 March, 1998, University of Twente, the Netherlands
    EditorsA. van den Berg, P. Bergveld
    Place of PublicationDordrecht
    PublisherKluwer Academic Publishers
    Pages275-280
    Number of pages6
    ISBN (Electronic)978-94-011-5010-1
    ISBN (Print)978-94-010-6103-2
    DOIs
    Publication statusPublished - 14 Apr 1998
    EventDutch Sensor Conference 1998: Sensor Technology in the Netherlands: State of the Art - University of Twente, Enschede, Netherlands
    Duration: 2 Mar 19983 Mar 1998

    Publication series

    NameMESA monographs
    PublisherKluwer Academic Publishers
    Volume2

    Conference

    ConferenceDutch Sensor Conference 1998
    CountryNetherlands
    CityEnschede
    Period2/03/983/03/98

    Keywords

    • Current standard
    • Current comparator
    • Resistance
    • SQUID
    • Metrology

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