Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films

P.L.K. Phan le kim, N.H. Luong, D.H. Tong

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd National Workshop on condensed matter physics
    Place of PublicationDoson, Vietnam
    Publication statusPublished - 6 Aug 1998


    • METIS-113693

    Cite this