Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films

P.L.K. Phan le kim, N.H. Luong, D.H. Tong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 2nd National Workshop on condensed matter physics
Place of Publication	Doson, Vietnam
Pages	402-408
Publication status	Published - 6 Aug 1998

Keywords

@inproceedings{96952f20a0ea464daeeda1519d8fef17,

title = "Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films",

keywords = "METIS-113693",

author = "{Phan le kim}, P.L.K. and N.H. Luong and D.H. Tong",

year = "1998",

month = aug,

day = "6",

language = "Undefined",

pages = "402--408",

booktitle = "Proceedings of the 2nd National Workshop on condensed matter physics",

}

Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films. / Phan le kim, P.L.K.; Luong, N.H.; Tong, D.H.
Proceedings of the 2nd National Workshop on condensed matter physics. Doson, Vietnam, 1998. p. 402-408.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films

AU - Phan le kim, P.L.K.

AU - Luong, N.H.

AU - Tong, D.H.

PY - 1998/8/6

Y1 - 1998/8/6

KW - METIS-113693

M3 - Conference contribution

SP - 402

EP - 408

BT - Proceedings of the 2nd National Workshop on condensed matter physics

CY - Doson, Vietnam

ER -