Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films

P.L.K. Phan le kim, N.H. Luong, D.H. Tong

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 2nd National Workshop on condensed matter physics
    Place of PublicationDoson, Vietnam
    Pages402-408
    Publication statusPublished - 6 Aug 1998

    Keywords

    • METIS-113693

    Cite this

    Phan le kim, P. L. K., Luong, N. H., & Tong, D. H. (1998). Development of field-dependence remanence measurements in perpendicular direction, applied to magnetic thin films. In Proceedings of the 2nd National Workshop on condensed matter physics (pp. 402-408). Doson, Vietnam.