DFT for Delay-Fault Diagnosis in Digital High-Speed ICs

Hans G. Kerkhoff, K. van Nee, H. Speek

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{3c67144dc3a34e8d994cd9e5bf7f4dc0,

title = "DFT for Delay-Fault Diagnosis in Digital High-Speed ICs",

keywords = "METIS-113041",

author = "Kerkhoff, {Hans G.} and {van Nee}, K. and H. Speek",

year = "1999",

month = may,

day = "1",

language = "Undefined",

pages = "4/9--4/10",

booktitle = "IEEE European Test Workshop",

}