Diagnostic analysis of the charge transfer in CCDs

Hans Wallinga, Hans L.M. van Ruyven

Research output: Contribution to conferencePaperAcademic

42 Downloads (Pure)

Abstract

A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
Original languageUndefined
Pages148-149
DOIs
Publication statusPublished - 1974
EventIEEE International Solid-State Circuits Conference, ISSCC 1974 - Philadelphia, United States
Duration: 13 Feb 197415 Feb 1974

Conference

ConferenceIEEE International Solid-State Circuits Conference, ISSCC 1974
Abbreviated titleISSCC
CountryUnited States
CityPhiladelphia
Period13/02/7415/02/74

Keywords

  • IR-56118

Cite this

Wallinga, H., & van Ruyven, H. L. M. (1974). Diagnostic analysis of the charge transfer in CCDs. 148-149. Paper presented at IEEE International Solid-State Circuits Conference, ISSCC 1974, Philadelphia, United States. https://doi.org/10.1109/ISSCC.1974.1155320
Wallinga, Hans ; van Ruyven, Hans L.M. / Diagnostic analysis of the charge transfer in CCDs. Paper presented at IEEE International Solid-State Circuits Conference, ISSCC 1974, Philadelphia, United States.
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title = "Diagnostic analysis of the charge transfer in CCDs",
abstract = "A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.",
keywords = "IR-56118",
author = "Hans Wallinga and {van Ruyven}, {Hans L.M.}",
year = "1974",
doi = "10.1109/ISSCC.1974.1155320",
language = "Undefined",
pages = "148--149",
note = "null ; Conference date: 13-02-1974 Through 15-02-1974",

}

Wallinga, H & van Ruyven, HLM 1974, 'Diagnostic analysis of the charge transfer in CCDs' Paper presented at IEEE International Solid-State Circuits Conference, ISSCC 1974, Philadelphia, United States, 13/02/74 - 15/02/74, pp. 148-149. https://doi.org/10.1109/ISSCC.1974.1155320

Diagnostic analysis of the charge transfer in CCDs. / Wallinga, Hans; van Ruyven, Hans L.M.

1974. 148-149 Paper presented at IEEE International Solid-State Circuits Conference, ISSCC 1974, Philadelphia, United States.

Research output: Contribution to conferencePaperAcademic

TY - CONF

T1 - Diagnostic analysis of the charge transfer in CCDs

AU - Wallinga, Hans

AU - van Ruyven, Hans L.M.

PY - 1974

Y1 - 1974

N2 - A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.

AB - A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.

KW - IR-56118

U2 - 10.1109/ISSCC.1974.1155320

DO - 10.1109/ISSCC.1974.1155320

M3 - Paper

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EP - 149

ER -

Wallinga H, van Ruyven HLM. Diagnostic analysis of the charge transfer in CCDs. 1974. Paper presented at IEEE International Solid-State Circuits Conference, ISSCC 1974, Philadelphia, United States. https://doi.org/10.1109/ISSCC.1974.1155320