Diagnostic analysis of the charge transfer in CCDs

Hans Wallinga, Hans L.M. van Ruyven

    Research output: Contribution to conferencePaper

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    Abstract

    A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.
    Original languageUndefined
    Pages148-149
    DOIs
    Publication statusPublished - 1974
    EventIEEE International Solid-State Circuits Conference, ISSCC 1974 - Philadelphia, United States
    Duration: 13 Feb 197415 Feb 1974

    Conference

    ConferenceIEEE International Solid-State Circuits Conference, ISSCC 1974
    Abbreviated titleISSCC
    CountryUnited States
    CityPhiladelphia
    Period13/02/7415/02/74

    Keywords

    • IR-56118

    Cite this

    Wallinga, H., & van Ruyven, H. L. M. (1974). Diagnostic analysis of the charge transfer in CCDs. 148-149. Paper presented at IEEE International Solid-State Circuits Conference, ISSCC 1974, Philadelphia, United States. https://doi.org/10.1109/ISSCC.1974.1155320