Diagnostic analysis of the charge transfer in CCDs

Hans Wallinga; Hans L.M. van Ruyven

doi:10.1109/ISSCC.1974.1155320

Diagnostic analysis of the charge transfer in CCDs

Hans Wallinga
, Hans L.M. van Ruyven

Research output: Contribution to conference › Paper

210 Downloads (Pure)

Abstract

A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.

Original language	Undefined
Pages	148-149
DOIs	https://doi.org/10.1109/ISSCC.1974.1155320
Publication status	Published - 1974
Event	IEEE International Solid-State Circuits Conference, ISSCC 1974 - Philadelphia, United States Duration: 13 Feb 1974 → 15 Feb 1974

Conference

Conference	IEEE International Solid-State Circuits Conference, ISSCC 1974
Abbreviated title	ISSCC
Country/Territory	United States
City	Philadelphia
Period	13/02/74 → 15/02/74

Keywords

IR-56118

Access to Document

10.1109/ISSCC.1974.1155320

01155320

Cite this

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title = "Diagnostic analysis of the charge transfer in CCDs",

abstract = "A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.",

keywords = "IR-56118",

author = "Hans Wallinga and \{van Ruyven\}, \{Hans L.M.\}",

year = "1974",

doi = "10.1109/ISSCC.1974.1155320",

language = "Undefined",

pages = "148--149",

note = "IEEE International Solid-State Circuits Conference, ISSCC 1974 ; Conference date: 13-02-1974 Through 15-02-1974",

}

TY - CONF

T1 - Diagnostic analysis of the charge transfer in CCDs

AU - Wallinga, Hans

AU - van Ruyven, Hans L.M.

PY - 1974

Y1 - 1974

N2 - A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.

AB - A small signal low-frequency measurement method to analyze the charge transfer mechanism in CCDs, occurring within time intervals between 1 ns and 1μs, using trapezoidal clock waveforms at frequencies below 1 MHz, will be covered.

KW - IR-56118

U2 - 10.1109/ISSCC.1974.1155320

DO - 10.1109/ISSCC.1974.1155320

M3 - Paper

SP - 148

EP - 149

T2 - IEEE International Solid-State Circuits Conference, ISSCC 1974

Y2 - 13 February 1974 through 15 February 1974

ER -