Diagnostic test-pattern generation for delay faults using TDgen

G. van Brakel, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop
    Place of PublicationSete, France
    Pages238-242
    Publication statusPublished - 12 Jun 1996

    Keywords

    • METIS-112950

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