Diagnostic test-pattern generation for delay faults using TDgen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE European Test Workshop
Place of Publication	Sete, France
Pages	238-242
Publication status	Published - 12 Jun 1996

van Brakel, G., & Kerkhoff, H. G. (1996). Diagnostic test-pattern generation for delay faults using TDgen. In Proceedings of the IEEE European Test Workshop (pp. 238-242). Sete, France.

@inproceedings{72b8d47a8f264156b6496562f7ed6e45,

title = "Diagnostic test-pattern generation for delay faults using TDgen",

keywords = "METIS-112950",

author = "{van Brakel}, G. and Kerkhoff, {Hans G.}",

year = "1996",

month = "6",

day = "12",

language = "Undefined",

pages = "238--242",

booktitle = "Proceedings of the IEEE European Test Workshop",

}