Diagnostic test-pattern generation for delay faults using TDgen

G. van Brakel, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop
    Place of PublicationSete, France
    Pages238-242
    Publication statusPublished - 12 Jun 1996

    Keywords

    • METIS-112950

    Cite this

    van Brakel, G., & Kerkhoff, H. G. (1996). Diagnostic test-pattern generation for delay faults using TDgen. In Proceedings of the IEEE European Test Workshop (pp. 238-242). Sete, France.