Digital Delay Line Characterization Using the Oscillation Technique

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationInf. Digest 7th European Test Workshop
    Place of PublicationCorfu, Greece
    Pages117-118
    Number of pages2
    Publication statusPublished - 26 May 2002

    Keywords

    • METIS-209314

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