Digitally generated CPFSK IF test signals including phase noise

P. van Bennekom; E. van der Put; Wim van Etten; H. van den Boom

doi:10.1109/68.393211

Digitally generated CPFSK IF test signals including phase noise

P. van Bennekom, E. van der Put, Wim van Etten, H. van den Boom

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Abstract

We present a simple, all electrical method for the generation of test signals for testing of fiber-optic coherent CPFSK IF receiver systems, using a programmable bit error rate tester. The feature to be able to add phase noise to the IF signal makes it possible to evaluate receiver system behavior with relation to local oscillator phase noise.

Original language	Undefined
Pages (from-to)	801-803
Journal	IEEE photonics technology letters
Volume	7
Issue number	7
DOIs	https://doi.org/10.1109/68.393211
Publication status	Published - 1995

Keywords

METIS-111556
IR-97938

Access to Document

10.1109/68.393211

00393211

Cite this

@article{5ce787ddfbc34f9284da9abc39b8485b,

title = "Digitally generated CPFSK IF test signals including phase noise",

abstract = "We present a simple, all electrical method for the generation of test signals for testing of fiber-optic coherent CPFSK IF receiver systems, using a programmable bit error rate tester. The feature to be able to add phase noise to the IF signal makes it possible to evaluate receiver system behavior with relation to local oscillator phase noise.",

keywords = "METIS-111556, IR-97938",

author = "{van Bennekom}, P. and {van der Put}, E. and {van Etten}, Wim and {van den Boom}, H.",

year = "1995",

doi = "10.1109/68.393211",

language = "Undefined",

volume = "7",

pages = "801--803",

journal = "IEEE photonics technology letters",

issn = "1041-1135",

publisher = "IEEE",

number = "7",

}

TY - JOUR

T1 - Digitally generated CPFSK IF test signals including phase noise

AU - van Bennekom, P.

AU - van der Put, E.

AU - van Etten, Wim

AU - van den Boom, H.

PY - 1995

Y1 - 1995

N2 - We present a simple, all electrical method for the generation of test signals for testing of fiber-optic coherent CPFSK IF receiver systems, using a programmable bit error rate tester. The feature to be able to add phase noise to the IF signal makes it possible to evaluate receiver system behavior with relation to local oscillator phase noise.

AB - We present a simple, all electrical method for the generation of test signals for testing of fiber-optic coherent CPFSK IF receiver systems, using a programmable bit error rate tester. The feature to be able to add phase noise to the IF signal makes it possible to evaluate receiver system behavior with relation to local oscillator phase noise.

KW - METIS-111556

KW - IR-97938

U2 - 10.1109/68.393211

DO - 10.1109/68.393211

M3 - Article

VL - 7

SP - 801

EP - 803

JO - IEEE photonics technology letters

JF - IEEE photonics technology letters

SN - 1041-1135

IS - 7

ER -