Direct measurement of the on-chip insertion loss of high finesse microring resonators in Si3N4-SiO2 technology

F.S. Tan, D.J.W. Klunder, H.F. Bulthuis, G. Sengo, G. Sengo, Hugo Hoekstra, A. Driessen

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    Abstract

    Microring resonators show the possibility for designing Very Large Scale Integrated (VLSI) photonic circuits by cascading them. In order to realize the devices, the on-chip insertion loss becomes an important parameter. The direct measurement of the on-chip insertion loss of a high finesse microring resonator will be presented. Its value (0.1 ± 0.1) dB is low, in agreement with calculations.
    Original languageUndefined
    Title of host publicationProceedings IEEE / LEOS
    EditorsH. Thienpont, F. Berghmans, J. Danckaert, L. Desmet
    Place of PublicationBrussels, Belgium
    PublisherVUB Press
    Pages181-184
    Number of pages4
    ISBN (Print)90-5487247-0
    Publication statusPublished - 3 Dec 2001
    Event6th annual symposium of the IEEE/LEOS Benelux Chapter 2001 - Brussels, Belgium, Brussels, Belgium
    Duration: 3 Dec 20013 Dec 2001
    Conference number: 6

    Publication series

    Name
    PublisherVUB Press

    Conference

    Conference6th annual symposium of the IEEE/LEOS Benelux Chapter 2001
    CountryBelgium
    CityBrussels
    Period3/12/013/12/01
    OtherDecember 3, 2001

    Keywords

    • METIS-204487
    • IR-58185

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