Direct measurement of the on-chip insertion loss of high finesse microring resonators in Si3N4-SiO2 technology

F.S. Tan, D.J.W. Klunder, H.F. Bulthuis, G. Sengo, G. Sengo, Hugo Hoekstra, A. Driessen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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