Disposable Attenuated Total Reflection-Infrared Crystals from Silicon Wafer: A Versatile Approach to Surface Infrared Spectroscopy

Engin Karabudak, Recep Kas, Wojciech Ogieglo, Damon Rafieian Boroujeni, Stefan Schlautmann, Rob G.H. Lammertink, Johannes G.E. Gardeniers, Guido Mul

Research output: Contribution to journalArticleAcademicpeer-review

27 Citations (Scopus)

Abstract

Attenuated total reflection-infrared (ATR-IR) spectroscopy is increasingly used to characterize solids and liquids as well as (catalytic) chemical conversion. Here we demonstrate that a piece of silicon wafer cut by a dicing machine or cleaved manually can be used as disposable internal reflection element (IRE) without the need for polishing and laborious edge preparation. Technical aspects, fundamental differences, and pros and cons of these novel disposable IREs and commercial IREs are discussed. The use of a crystal (the Si wafer) in a disposable manner enables simultaneous preparation and analysis of substrates and application of ATR spectroscopy in high temperature processes that may lead to irreversible interaction between the crystal and the substrate. As representative application examples, the disposable IREs were used to study high temperature thermal decomposition and chemical changes of polyvinyl alcohol (PVA) in a titania (TiO2) matrix and assemblies of 65–450 nm thick polystyrene (PS) films
Original languageEnglish
Pages (from-to)33-38
JournalAnalytical chemistry
Volume85
Issue number1
DOIs
Publication statusPublished - 4 Dec 2013

Keywords

  • METIS-291366
  • IR-85197

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