Distribution and thickness of the surface contaminations on STM tungsten tips studied by SEM/AES and (AR)XPS

A.H.J. van den Berg

Research output: Contribution to conference › Poster › Other research output

Original language	English
Publication status	Published - 29 Jan 1991
Event	15. Kolloquium über Werkstoffanalytik 1991 - Technische Universität Wien, Vienna, Austria Duration: 27 Jan 1991 → 29 Jan 1991

Conference	15. Kolloquium über Werkstoffanalytik 1991
Country/Territory	Austria
City	Vienna
Period	27/01/91 → 29/01/91

Cite this

@conference{4b7e65fd76e24efcb891a9384742d050,

title = "Distribution and thickness of the surface contaminations on STM tungsten tips studied by SEM/AES and (AR)XPS",

author = "{van den Berg}, A.H.J.",

year = "1991",

month = jan,

day = "29",

language = "English",

note = "15. Kolloquium {\"u}ber Werkstoffanalytik 1991 ; Conference date: 27-01-1991 Through 29-01-1991",

}