Distribution and thickness of the surface contaminations on STM tungsten tips studied by SEM/AES and (AR)XPS

A.H.J. van den Berg

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Publication statusPublished - 29 Jan 1991
Event15. Kolloquium über Werkstoffanalytik 1991 - Technische Universität Wien, Vienna, Austria
Duration: 27 Jan 199129 Jan 1991

Conference

Conference15. Kolloquium über Werkstoffanalytik 1991
CountryAustria
CityVienna
Period27/01/9129/01/91

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