Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS

W.F. Lisowski, A.H.J. van den Berg, Albert van den Berg, L.J. Hanekamp, Lambertus J. Hanekamp, Arend van Silfhout

Research output: Contribution to journalArticleAcademic

3 Citations (Scopus)
74 Downloads (Pure)

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