Distribution of the critical current density and flux trapping in YBa2Cu3O7-delta ramp-edge Josephson junctions

A. Marx, K.D. Husemann, B. Mayer, T. Nissel, R. Gross, M.A.J. Verhoeven, G.J. Gerritsma

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Abstract

We have studied the spatial distribution of the critical current density in YBa2Cu3O7−δ ramp edge Josephson junctions using low‐temperature scanning electron microscopy. Applying this technique allows the imaging of the critical current density distribution with a spatial resolution of about 1 μm. Our measurements show that the geometry of the ramp‐edge junction eases the trapping of magnetic flux quanta in the YBa2Cu3O7−δ layer covering the ramp edge. These trapped flux quanta result in a spatially inhomogeneousmagnetic field parallel to the barrier layer, which in turn results in a spatially modulated supercurrent density and an unusual magnetic field dependence of the critical current.
Original languageEnglish
Pages (from-to)241-243
Number of pages3
JournalApplied physics letters
Volume64
Issue number2
DOIs
Publication statusPublished - 1994

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Marx, A., Husemann, K. D., Mayer, B., Nissel, T., Gross, R., Verhoeven, M. A. J., & Gerritsma, G. J. (1994). Distribution of the critical current density and flux trapping in YBa2Cu3O7-delta ramp-edge Josephson junctions. Applied physics letters, 64(2), 241-243. https://doi.org/10.1063/1.111516