Distributions of functional groups in plasma polymerized allyamine films by scanning force microscopy using functionalized probe tips

H. Schönherr, M. T. Van Os, R. Förch, R. B. Timmons, W. Knoll, G. J. Vancso*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

49 Citations (Scopus)

Abstract

Thin films of poly(allylamine) on silicon were prepared by polymerization of allylamine in a pulsed glow-discharge plasma reactor. The films were characterized by surface plasmon spectroscopy (SPS) and waveguide mode spectroscopy (WaMS), as well as by X-ray photoelectron spectroscopy (XPS) and FT-IR spectroscopy. It was shown that by variation of the duty cycle the film thickness as well as the content of amino and nitrile groups could be controlled. Scanning force microscopy (SFM) measurements with chemically functionalized tips led to a qualitative correlation of adhesion forces with the content of amino groups. Laterally resolved adhesion force measurements indicated the presence of a heterogeneous local environment of the amino groups, with patches exhibiting differences in hydrophobicity on a sub-50-nm scale.

Original languageEnglish
Pages (from-to)3689-3694
Number of pages6
JournalChemistry of materials
Volume12
Issue number12
DOIs
Publication statusPublished - 1 Dec 2000

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