Domain studies of CoCr with perpendicular anisotropy

J.C. Lodder, D. Wind, T.J.A. Popma, A. Hubert

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    Abstract

    R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.
    Original languageUndefined
    Pages (from-to)2055-2057
    Number of pages3
    JournalIEEE transactions on magnetics
    Volume23
    Issue number5
    Publication statusPublished - 1987

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • IR-55588
    • SMI-MAT: MATERIALS
    • EWI-5554

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