Abstract
R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.
Original language | Undefined |
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Pages (from-to) | 2055-2057 |
Number of pages | 3 |
Journal | IEEE transactions on magnetics |
Volume | 23 |
Issue number | 5 |
Publication status | Published - 1987 |
Keywords
- SMI-TST: From 2006 in EWI-TST
- IR-55588
- SMI-MAT: MATERIALS
- EWI-5554