Domain studies of CoCr with perpendicular anisotropy

J.C. Lodder; D. Wind; T.J.A. Popma; A. Hubert

Domain studies of CoCr with perpendicular anisotropy

J.C. Lodder
, D. Wind
, T.J.A. Popma
, A. Hubert

Research output: Contribution to journal › Article › Academic › peer-review

12 Citations (Scopus)

264 Downloads (Pure)

Abstract

R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.

Original language	Undefined
Pages (from-to)	2055-2057
Number of pages	3
Journal	IEEE transactions on magnetics
Volume	23
Issue number	5
Publication status	Published - 1987

Keywords

SMI-TST: From 2006 in EWI-TST
IR-55588
SMI-MAT: MATERIALS
EWI-5554

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Cite this

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title = "Domain studies of CoCr with perpendicular anisotropy",

abstract = "R.F. Magnetron sputtered CoCr films (79/21 at\%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.",

keywords = "SMI-TST: From 2006 in EWI-TST, IR-55588, SMI-MAT: MATERIALS, EWI-5554",

author = "J.C. Lodder and D. Wind and T.J.A. Popma and A. Hubert",

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year = "1987",

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volume = "23",

pages = "2055--2057",

journal = "IEEE transactions on magnetics",

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TY - JOUR

T1 - Domain studies of CoCr with perpendicular anisotropy

AU - Lodder, J.C.

AU - Wind, D.

AU - Popma, T.J.A.

AU - Hubert, A.

N1 - Imported from SMI Reference manager

PY - 1987

Y1 - 1987

N2 - R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.

AB - R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.

KW - SMI-TST: From 2006 in EWI-TST

KW - IR-55588

KW - SMI-MAT: MATERIALS

KW - EWI-5554

M3 - Article

SN - 0018-9464

VL - 23

SP - 2055

EP - 2057

JO - IEEE transactions on magnetics

JF - IEEE transactions on magnetics

IS - 5

ER -