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Doping dependence of low-frequency noise in polycrystalline SiGe film resistors

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)516-518
    Number of pages3
    JournalApplied physics letters
    Volume1999
    Issue number75
    Publication statusPublished - 1999

    Keywords

    • METIS-111615

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