Dual model for hot carrier degradation in lateral DMOS devices

M.A.R.C. de Wolf, A.J. Mouthaan, C. de Keukeleire, E. van de Bossche

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationEnschede, the Netherlands
    Publication statusPublished - 23 Jun 1998

    Keywords

    • METIS-114925

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