| Original language | Undefined |
|---|---|
| Place of Publication | Enschede, the Netherlands |
| Publication status | Published - 23 Jun 1998 |
Keywords
- METIS-114925
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Dual model for hot carrier degradation in lateral DMOS devices
- M.A.R.C. de Wolf
- , A.J. Mouthaan
- , C. de Keukeleire
- , E. van de Bossche
Research output: Other contribution › Other research output