Abstract
The dynamic behavior of surface dimers on Ge(001) has been studied by positioning the tip of a scanning tunneling microscope over single flip-flopping dimers and measuring the tunneling current as a function of time. We observe that not just symmetric, but also asymmetric appearing dimers exhibit flip-flop motion. The dynamics of flip-flopping dimers can be used to sensitively gauge the local potential landscape of the surface. Through a spatial and time-resolved measurement of the flip-flop frequency of the dimers, local strain fields near surface defects can be accurately probed.
Original language | Undefined |
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Pages (from-to) | 266104- |
Number of pages | 4 |
Journal | Physical review letters |
Volume | 97 |
Issue number | 26 |
DOIs | |
Publication status | Published - 2006 |
Keywords
- METIS-235739
- IR-73061