Early resistance change modelling in electromigration

A.J. Mouthaan, V. Petrescu, W. Schoenmaker, F. Groot, S. Angelescu, J. Niehof, M.D. Profirescu

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    5 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings of the 25th European Solid State Device Research Conference, ESSDERC '95
    Place of PublicationThe Netherlands Congress Centre, The Hague
    Pages311-314
    Publication statusPublished - 25 Sep 1995

    Keywords

    • METIS-113990

    Cite this

    Mouthaan, A. J., Petrescu, V., Schoenmaker, W., Groot, F., Angelescu, S., Niehof, J., & Profirescu, M. D. (1995). Early resistance change modelling in electromigration. In Proceedings of the 25th European Solid State Device Research Conference, ESSDERC '95 (pp. 311-314). The Netherlands Congress Centre, The Hague.