Early resistance change modelling in electromigration

A.J. Mouthaan; V. Petrescu; W. Schoenmaker; F. Groot; S. Angelescu; J. Niehof; M.D. Profirescu

Early resistance change modelling in electromigration

A.J. Mouthaan, V. Petrescu, W. Schoenmaker, F. Groot, S. Angelescu, J. Niehof, M.D. Profirescu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 25th European Solid State Device Research Conference, ESSDERC '95
Place of Publication	The Netherlands Congress Centre, The Hague
Pages	311-314
Publication status	Published - 25 Sept 1995

Keywords

METIS-113990

Cite this

@inproceedings{29320665a1ba4e2d983016c33024af42,

title = "Early resistance change modelling in electromigration",

keywords = "METIS-113990",

author = "A.J. Mouthaan and V. Petrescu and W. Schoenmaker and F. Groot and S. Angelescu and J. Niehof and M.D. Profirescu",

year = "1995",

month = sep,

day = "25",

language = "Undefined",

pages = "311--314",

booktitle = "Proceedings of the 25th European Solid State Device Research Conference, ESSDERC '95",

}

Early resistance change modelling in electromigration. / Mouthaan, A.J.; Petrescu, V.; Schoenmaker, W. et al.
Proceedings of the 25th European Solid State Device Research Conference, ESSDERC '95. The Netherlands Congress Centre, The Hague, 1995. p. 311-314.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Early resistance change modelling in electromigration

AU - Mouthaan, A.J.

AU - Petrescu, V.

AU - Schoenmaker, W.

AU - Groot, F.

AU - Angelescu, S.

AU - Niehof, J.

AU - Profirescu, M.D.

PY - 1995/9/25

Y1 - 1995/9/25

KW - METIS-113990

M3 - Conference contribution

SP - 311

EP - 314

BT - Proceedings of the 25th European Solid State Device Research Conference, ESSDERC '95

CY - The Netherlands Congress Centre, The Hague

ER -