Edge and line feature extraction based on covariance models

Ferdinand van der Heijden

doi:10.1109/34.368155

Edge and line feature extraction based on covariance models

Ferdinand van der Heijden

Research output: Contribution to journal › Article › Academic › peer-review

59 Citations (Scopus)

74 Downloads (Pure)

Abstract

Image segmentation based on contour extraction usually involves three stages of image operations: feature extraction, edge detection and edge linking. This paper is devoted to the first stage: a method to design feature extractors used to detect edges from noisy and/or blurred images.

Original language	English
Pages (from-to)	16-33
Number of pages	18
Journal	IEEE transactions on pattern analysis and machine intelligence
Volume	17
Issue number	1
DOIs	https://doi.org/10.1109/34.368155
Publication status	Published - 1995

Keywords

Image processing
Image segmentation
MRF
Line detection
Edge detection
Feature extraction

Access to Document

10.1109/34.368155

VanderHeijden1995edge
open
Final published version, 1.75 MB

http://www.scopus.com/inward/record.url?eid=2-s2.0-0029230071&partnerID=MN8TOARS

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Cite this

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title = "Edge and line feature extraction based on covariance models",

abstract = "Image segmentation based on contour extraction usually involves three stages of image operations: feature extraction, edge detection and edge linking. This paper is devoted to the first stage: a method to design feature extractors used to detect edges from noisy and/or blurred images.",

keywords = "Image processing, Image segmentation, MRF, Line detection, Edge detection, Feature extraction",

author = "{van der Heijden}, Ferdinand",

year = "1995",

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AU - van der Heijden, Ferdinand

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AB - Image segmentation based on contour extraction usually involves three stages of image operations: feature extraction, edge detection and edge linking. This paper is devoted to the first stage: a method to design feature extractors used to detect edges from noisy and/or blurred images.

KW - Image processing

KW - Image segmentation

KW - MRF

KW - Line detection

KW - Edge detection

KW - Feature extraction

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DO - 10.1109/34.368155

M3 - Article

VL - 17

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EP - 33

JO - IEEE transactions on pattern analysis and machine intelligence

JF - IEEE transactions on pattern analysis and machine intelligence

SN - 0162-8828

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